SHK-1 < 20200219101127-608023 > pub
  • technique: XRF
  • device: XRF PANalytical PW2400
  • modified at 2020-02-19
  • stone: SHK-1
measured value uncertainty unit description
[SiO2] 77.74 % measured at Rigaku Corporation
[MgO] 0.01 % measured at Rigaku Corporation
[Nb] 5.8 ppm measured at Rigaku Corporation
name global-id
name spots global-id