TG-50 < 20191114154456-652322 > pub
- technique: XRF procedures of Takei (2002)
- device: XRF PANalytical PW2400
- operator: Dejene
- modified at 2019-11-22
- stone: TG-50
| measured | value | uncertainty | unit | description | |
|---|---|---|---|---|---|
| [SiO2] | 50.25 | % | |||
| [TiO2] | 2.74 | % | |||
| [Al2O3] | 13.11 | % | |||
| [Fe2O3] | 4.65 | % | |||
| [MnO] | 0.21 | % | |||
| [MgO] | 4.65 | % | |||
| [CaO] | 8.74 | % | |||
| [Na2O] | 3.0 | % | |||
| [K2O] | 1.0 | % | |||
| [P2O5] | 0.38 | % | |||
| total | 99.0 | % | |||
| [Cr] | 75.9 | ppm | |||
| [Ni] | 44.9 | ppm | |||