MM-534 < 20191114154451-330831 > pub
  • technique: XRF procedures of Takei (2002)
  • device: XRF PANalytical PW2400
  • operator: Dejene
  • modified at 2019-11-22
  • stone: MM-534
measured value uncertainty unit description
[SiO2] 45.99 %
[TiO2] 3.45 %
[Al2O3] 15.72 %
[Fe2O3] 4.98 %
[MnO] 0.18 %
[MgO] 5.9 %
[CaO] 7.61 %
[Na2O] 3.2 %
[K2O] 1.22 %
[P2O5] 0.5 %
total 99.9 %
[Cr] 38.5 ppm
[Ni] 37.1 ppm
name global-id
name spots global-id