MM-560 < 20191114154450-374965 > pub
  • technique: XRF procedures of Takei (2002)
  • device: XRF PANalytical PW2400
  • operator: Dejene
  • modified at 2019-11-22
  • stone: MM-560
measured value uncertainty unit description
[SiO2] 45.87 %
[TiO2] 3.87 %
[Al2O3] 14.2 %
[Fe2O3] 7.6 %
[MnO] 0.25 %
[MgO] 4.57 %
[CaO] 9.89 %
[Na2O] 3.3 %
[K2O] 0.79 %
[P2O5] 1.09 %
total 99.2 %
[Cr] 37.1 ppm
[Ni] 18.3 ppm
name global-id
name spots global-id