TS42 < 20191114154434-381258 > pub
  • technique: XRF procedures of Takei (2002)
  • device: XRF PANalytical PW2400
  • operator: Dejene
  • modified at 2019-11-14
  • stone: TS42
measured value uncertainty unit description
[SiO2] 48.45 %
[TiO2] 2.69 %
[Al2O3] 11.79 %
[Fe2O3] 1.63 %
[MnO] 0.18 %
[MgO] 8.55 %
[CaO] 10.73 %
[Na2O] 2.09 %
[K2O] 0.66 %
[P2O5] 0.27 %
total 100.0 %
[Cr] 601.3 ppm
[Ni] 263.7 ppm
name global-id
name spots global-id