TS40 < 20191114154434-086981 > pub
- technique: XRF procedures of Takei (2002)
- device: XRF PANalytical PW2400
- operator: Dejene
- modified at 2019-11-14
- stone: TS40
| measured | value | uncertainty | unit | description | |
|---|---|---|---|---|---|
| [SiO2] | 48.47 | % | |||
| [TiO2] | 2.78 | % | |||
| [Al2O3] | 14.06 | % | |||
| [Fe2O3] | 1.41 | % | |||
| [MnO] | 0.17 | % | |||
| [MgO] | 5.82 | % | |||
| [CaO] | 10.23 | % | |||
| [Na2O] | 2.53 | % | |||
| [K2O] | 0.87 | % | |||
| [P2O5] | 0.29 | % | |||
| total | 100.0 | % | |||
| [Cr] | 90.3 | ppm | |||
| [Ni] | 55.7 | ppm | |||