TS40 < 20191114154434-086981 > pub
  • technique: XRF procedures of Takei (2002)
  • device: XRF PANalytical PW2400
  • operator: Dejene
  • modified at 2019-11-14
  • stone: TS40
measured value uncertainty unit description
[SiO2] 48.47 %
[TiO2] 2.78 %
[Al2O3] 14.06 %
[Fe2O3] 1.41 %
[MnO] 0.17 %
[MgO] 5.82 %
[CaO] 10.23 %
[Na2O] 2.53 %
[K2O] 0.87 %
[P2O5] 0.29 %
total 100.0 %
[Cr] 90.3 ppm
[Ni] 55.7 ppm
name global-id
name spots global-id