TS35 < 20191114154431-382275 > pub
  • technique: XRF procedures of Takei (2002)
  • device: XRF PANalytical PW2400
  • operator: Dejene
  • modified at 2019-11-14
  • stone: TS35
measured value uncertainty unit description
[SiO2] 51.42 %
[TiO2] 3.35 %
[Al2O3] 13.88 %
[Fe2O3] 1.08 %
[MnO] 0.17 %
[MgO] 4.61 %
[CaO] 8.59 %
[Na2O] 3.07 %
[K2O] 1.18 %
[P2O5] 0.42 %
total 100.0 %
[Cr] 142.0 ppm
[Ni] 41.2 ppm
name global-id
name spots global-id