TS45 < 20191114154429-038473 > pub
  • technique: XRF procedures of Takei (2002)
  • device: XRF PANalytical PW2400
  • operator: Dejene
  • modified at 2019-11-14
  • stone: TS45
measured value uncertainty unit description
[SiO2] 48.2 %
[TiO2] 3.22 %
[Al2O3] 13.36 %
[Fe2O3] 1.71 %
[MnO] 0.19 %
[MgO] 5.89 %
[CaO] 10.06 %
[Na2O] 2.57 %
[K2O] 0.53 %
[P2O5] 0.34 %
total 100.0 %
[Cr] 122.0 ppm
[Ni] 95.6 ppm
name global-id
name spots global-id