TS45 < 20191114154429-038473 > pub
- technique: XRF procedures of Takei (2002)
- device: XRF PANalytical PW2400
- operator: Dejene
- modified at 2019-11-14
- stone: TS45
| measured | value | uncertainty | unit | description | |
|---|---|---|---|---|---|
| [SiO2] | 48.2 | % | |||
| [TiO2] | 3.22 | % | |||
| [Al2O3] | 13.36 | % | |||
| [Fe2O3] | 1.71 | % | |||
| [MnO] | 0.19 | % | |||
| [MgO] | 5.89 | % | |||
| [CaO] | 10.06 | % | |||
| [Na2O] | 2.57 | % | |||
| [K2O] | 0.53 | % | |||
| [P2O5] | 0.34 | % | |||
| total | 100.0 | % | |||
| [Cr] | 122.0 | ppm | |||
| [Ni] | 95.6 | ppm | |||