TS36 < 20191114154425-495322 > pub
  • technique: XRF procedures of Takei (2002)
  • device: XRF PANalytical PW2400
  • operator: Dejene
  • modified at 2019-11-14
  • stone: TS36
measured value uncertainty unit description
[SiO2] 47.96 %
[TiO2] 2.55 %
[Al2O3] 12.42 %
[Fe2O3] 1.51 %
[MnO] 0.18 %
[MgO] 9.71 %
[CaO] 9.87 %
[Na2O] 2.4 %
[K2O] 0.88 %
[P2O5] 0.34 %
total 100.0 %
[Cr] 685.0 ppm
[Ni] 181.0 ppm
name global-id
name spots global-id