TS16 < 20191114154424-735756 > pub
  • technique: XRF procedures of Takei (2002)
  • device: XRF PANalytical PW2400
  • operator: Dejene
  • modified at 2019-11-14
  • stone: TS16
measured value uncertainty unit description
[SiO2] 49.81 %
[TiO2] 3.33 %
[Al2O3] 13.72 %
[Fe2O3] 1.15 %
[MnO] 0.17 %
[MgO] 5.11 %
[CaO] 7.99 %
[Na2O] 2.91 %
[K2O] 1.42 %
[P2O5] 0.43 %
total 100.0 %
[Cr] 73.6 ppm
[Ni] 23.5 ppm
name global-id
name spots global-id