TS16 < 20191114154424-735756 > pub
- technique: XRF procedures of Takei (2002)
- device: XRF PANalytical PW2400
- operator: Dejene
- modified at 2019-11-14
- stone: TS16
| measured | value | uncertainty | unit | description | |
|---|---|---|---|---|---|
| [SiO2] | 49.81 | % | |||
| [TiO2] | 3.33 | % | |||
| [Al2O3] | 13.72 | % | |||
| [Fe2O3] | 1.15 | % | |||
| [MnO] | 0.17 | % | |||
| [MgO] | 5.11 | % | |||
| [CaO] | 7.99 | % | |||
| [Na2O] | 2.91 | % | |||
| [K2O] | 1.42 | % | |||
| [P2O5] | 0.43 | % | |||
| total | 100.0 | % | |||
| [Cr] | 73.6 | ppm | |||
| [Ni] | 23.5 | ppm | |||