TS12 < 20191114154421-470332 > pub
  • technique: XRF procedures of Takei (2002)
  • device: XRF PANalytical PW2400
  • operator: Dejene
  • modified at 2019-11-14
  • stone: TS12
measured value uncertainty unit description
[SiO2] 47.52 %
[TiO2] 3.62 %
[Al2O3] 13.82 %
[Fe2O3] 1.18 %
[MnO] 0.16 %
[MgO] 5.38 %
[CaO] 8.74 %
[Na2O] 2.95 %
[K2O] 1.21 %
[P2O5] 0.49 %
total 100.0 %
[Cr] 81.1 ppm
[Ni] 25.4 ppm
name global-id
name spots global-id