TS03 < 20191114154420-738392 > pub
- technique: XRF procedures of Takei (2002)
- device: XRF PANalytical PW2400
- operator: Dejene
- modified at 2019-11-14
- stone: TS03
| measured | value | uncertainty | unit | description | |
|---|---|---|---|---|---|
| [SiO2] | 45.2 | % | |||
| [TiO2] | 5.68 | % | |||
| [Al2O3] | 10.97 | % | |||
| [Fe2O3] | 1.27 | % | |||
| [MnO] | 0.17 | % | |||
| [MgO] | 6.59 | % | |||
| [CaO] | 9.21 | % | |||
| [Na2O] | 2.5 | % | |||
| [K2O] | 1.85 | % | |||
| [P2O5] | 0.61 | % | |||
| total | 100.0 | % | |||
| [Cr] | 182.0 | ppm | |||
| [Ni] | 109.0 | ppm | |||