I2S3 < 20191114154418-003510 > pub
  • technique: XRF procedures of Takei (2002)
  • device: XRF PANalytical PW2400
  • operator: Dejene
  • modified at 2019-11-14
  • stone: I2S3
measured value uncertainty unit description
[SiO2] 44.12 %
[TiO2] 2.11 %
[Al2O3] 8.51 %
[Fe2O3] 1.16 %
[MnO] 0.17 %
[MgO] 19.29 %
[CaO] 8.53 %
[Na2O] 1.19 %
[K2O] 0.4 %
[P2O5] 0.26 %
total 100.0 %
[Cr] 1439.0 ppm
[Ni] 937.0 ppm
name global-id
name spots global-id