I2S3 < 20191114154418-003510 > pub
- technique: XRF procedures of Takei (2002)
- device: XRF PANalytical PW2400
- operator: Dejene
- modified at 2019-11-14
- stone: I2S3
| measured | value | uncertainty | unit | description | |
|---|---|---|---|---|---|
| [SiO2] | 44.12 | % | |||
| [TiO2] | 2.11 | % | |||
| [Al2O3] | 8.51 | % | |||
| [Fe2O3] | 1.16 | % | |||
| [MnO] | 0.17 | % | |||
| [MgO] | 19.29 | % | |||
| [CaO] | 8.53 | % | |||
| [Na2O] | 1.19 | % | |||
| [K2O] | 0.4 | % | |||
| [P2O5] | 0.26 | % | |||
| total | 100.0 | % | |||
| [Cr] | 1439.0 | ppm | |||
| [Ni] | 937.0 | ppm | |||