A2 < 20191114154417-255665 > pub
  • technique: XRF procedures of Takei (2002)
  • device: XRF PANalytical PW2400
  • operator: Dejene
  • modified at 2019-11-14
  • stone: A2
measured value uncertainty unit description
[SiO2] 48.01 %
[TiO2] 3.06 %
[Al2O3] 13.19 %
[Fe2O3] 1.13 %
[MnO] 0.16 %
[MgO] 6.9 %
[CaO] 10.0 %
[Na2O] 2.31 %
[K2O] 0.89 %
[P2O5] 0.31 %
total 100.0 %
[Cr] 187.0 ppm
[Ni] 16.8 ppm
name global-id
name spots global-id