TS06 < 20191114154410-526774 > pub
- technique: XRF procedures of Takei (2002)
- device: XRF PANalytical PW2400
- operator: Dejene
- modified at 2019-11-14
- stone: TS06
| measured | value | uncertainty | unit | description | |
|---|---|---|---|---|---|
| [SiO2] | 41.63 | % | |||
| [TiO2] | 3.53 | % | |||
| [Al2O3] | 5.07 | % | |||
| [Fe2O3] | 1.21 | % | |||
| [MnO] | 0.16 | % | |||
| [MgO] | 21.42 | % | |||
| [CaO] | 8.55 | % | |||
| [Na2O] | 0.88 | % | |||
| [K2O] | 0.94 | % | |||
| [P2O5] | 0.34 | % | |||
| total | 100.0 | % | |||
| [Cr] | 1639.0 | ppm | |||
| [Ni] | 834.0 | ppm | |||