BX252 < 20191016095702-105406 > pub
  • technique: XRF procedures of Takei (2002)
  • device: XRF PANalytical PW2400
  • operator: Shimizu
  • modified at 2019-10-16
  • stone: BX252
measured value uncertainty unit description
[K2O] 0.046 %
[SiO2] 48.56 %
[TiO2] 0.74 %
[Al2O3] 14.48 %
[Cr2O3] 0.06 %
[FeOT] 10.99 %
[MnO] 0.19 %
[NiO] 0.023 %
[MgO] 8.36 %
[CaO] 11.66 %
[Na2O] 1.67 %
[P2O5] 0.059 %
name global-id
name spots global-id