BX153 < 20191016095700-454049 > pub
  • technique: XRF procedures of Takei (2002)
  • device: XRF PANalytical PW2400
  • operator: Shimizu
  • modified at 2019-10-16
  • stone: BX153
measured value uncertainty unit description
[SiO2] 50.25 %
[TiO2] 1.25 %
[Al2O3] 13.79 %
[Cr2O3] 0.03 %
[FeOT] 11.82 %
[MnO] 0.26 %
[NiO] 0.014 %
[MgO] 6.2 %
[CaO] 10.85 %
[Na2O] 1.68 %
[K2O] 0.1 %
[P2O5] 0.11 %
name global-id
name spots global-id