BX119 < 20191016095659-800325 > pub
  • technique: XRF procedures of Takei (2002)
  • device: XRF PANalytical PW2400
  • operator: Shimizu
  • modified at 2019-10-16
  • stone: BX119
measured value uncertainty unit description
[SiO2] 51.8 %
[TiO2] 0.56 %
[Al2O3] 13.81 %
[Cr2O3] 0.05 %
[FeOT] 9.28 %
[MnO] 0.16 %
[NiO] 0.019 %
[MgO] 8.26 %
[CaO] 10.85 %
[Na2O] 1.68 %
[K2O] 0.088 %
[P2O5] 0.044 %
name global-id
name spots global-id