BX4 < 20191016095658-820059 > pub
  • technique: XRF procedures of Takei (2002)
  • device: XRF PANalytical PW2400
  • operator: Shimizu
  • modified at 2019-10-16
  • stone: BX4
measured value uncertainty unit description
[SiO2] 47.7 %
[TiO2] 0.43 %
[Al2O3] 8.73 %
[Cr2O3] 0.35 %
[FeOT] 11.25 %
[MnO] 0.2 %
[NiO] 0.074 %
[MgO] 16.9 %
[CaO] 8.89 %
[Na2O] 1.24 %
[P2O5] 0.03 %
[K2O] 0.085 %
name global-id
name spots global-id