AON-20 < 20190829093044-508592 > pub
  • technique: XRF procedures of Takei (2002)
  • device: XRF PANalytical PW2400
  • operator: Ivan
  • modified at 2019-08-29
  • stone: AON-20
measured value uncertainty unit description
[SiO2] 64.68 %
[TiO2] 0.62 %
[Al2O3] 16.89 %
[Fe2O3] 4.1 %
[FeO] 0.1 %
[MnO] 0.09 %
[MgO] 2.0 %
[CaO] 3.94 %
[Na2O] 4.09 %
[K2O] 2.01 %
[P2O5] 0.29 %
[LOI] 1.6 %
total 100.61 %
name global-id
name spots global-id