AON-16 < 20190829093043-646007 > pub
  • technique: XRF procedures of Takei (2002)
  • device: XRF PANalytical PW2400
  • operator: Ivan
  • modified at 2019-08-29
  • stone: AON-16
measured value uncertainty unit description
[SiO2] 60.18 %
[TiO2] 0.79 %
[Al2O3] 16.72 %
[Fe2O3] 5.21 %
[FeO] 0.03 %
[MnO] 0.09 %
[MgO] 3.25 %
[CaO] 5.86 %
[Na2O] 4.05 %
[K2O] 2.01 %
[P2O5] 0.34 %
[LOI] 1.1 %
total 99.76 %
name global-id
name spots global-id