AON-05 < 20190829093040-813916 > pub
  • technique: XRF procedures of Takei (2002)
  • device: XRF PANalytical PW2400
  • operator: Ivan
  • modified at 2019-08-29
  • stone: AON-05
measured value uncertainty unit description
[SiO2] 63.39 %
[TiO2] 0.58 %
[Al2O3] 17.96 %
[Fe2O3] 1.79 %
[FeO] 2.09 %
[MnO] 0.08 %
[MgO] 2.13 %
[CaO] 4.11 %
[Na2O] 3.35 %
[K2O] 1.5 %
[P2O5] 0.17 %
[LOI] 1.7 %
total 99.41 %
name global-id
name spots global-id