AON-03 < 20190829093039-159378 > pub
  • technique: XRF procedures of Takei (2002)
  • device: XRF PANalytical PW2400
  • operator: Ivan
  • modified at 2019-08-29
  • stone: AON-03
measured value uncertainty unit description
[SiO2] 63.4 %
[TiO2] 0.56 %
[Al2O3] 17.16 %
[Fe2O3] 0.84 %
[FeO] 2.65 %
[MnO] 0.07 %
[MgO] 2.36 %
[CaO] 4.69 %
[Na2O] 4.21 %
[K2O] 1.56 %
[P2O5] 0.15 %
[LOI] 1.2 %
total 99.3 %
name global-id
name spots global-id