in-situ major for diaplectic plagioclase (grain C) < 20120223183145-756-686 > pub
  • technique: SEM-EDS
  • device: SEM-EDS JEOL JSM-7001F
  • operator: TT
  • description: concentrations less than 0.2 wt% were treated as being "below detection limit" and the total abundance of oxides was normalized to 100 wt%
  • modified at 2018-12-20
  • stone: en-px-K002-b (major@pl)
measured value uncertainty unit description
[SiO2] 66.95 0.77 cg/g
[Al2O3] 20.91 0.16 cg/g
[FeO] 0.25 cg/g
[NiO] 0.35 0.13 cg/g
[CaO] 2.28 0.1 cg/g
[Na2O] 8.78 1.09 cg/g
[K2O] 0.94 0.16 cg/g
total 100.0 cg/g
name global-id
name spots global-id