D20 < 20190528112724-578389 > pub
  • technique: XRF procedures of Takei (2002)
  • device: XRF PANalytical PW2400
  • operator: Aka
  • modified at 2019-05-28
  • stone: D20
measured value uncertainty unit description
[SiO2] 47.3 %
[TiO2] 2.8 %
[Al2O3] 15.19 %
[Fe2O3T] 12.4 %
[MnO] 0.18 %
[MgO] 7.49 %
[CaO] 8.2 %
[Na2O] 4.35 %
[K2O] 1.86 %
[P2O5] 0.86 %
[LOI] -0.33 %
total 100.4 %
[Cr] 190.0 ppm
[Ni] 136.0 ppm
name global-id
name spots global-id