1999-2 < 20190522153222-813090 > pub
  • technique: XRF procedures of Takei (2002)
  • device: XRF PANalytical PW2400
  • operator: Yokoyama
  • modified at 2019-05-24
  • stone: 1999-2
measured value uncertainty unit description
[SiO2] 45.8 %
[TiO2] 3.24 %
[Al2O3] 15.4 %
[MnO] 0.2 %
[MgO] 6.34 %
[Na2O] 4.05 %
[K2O] 1.62 %
[P2O5] 0.72 %
[LOI] -0.56 %
total 99.8 %
[Cr2O3] 206.0 ppm
[NiO] 100.0 ppm
[CaO] 10.59 %
name global-id
name spots global-id