1982-2 < 20190522153221-963853 > pub
  • technique: XRF procedures of Takei (2002)
  • device: XRF PANalytical PW2400
  • operator: Yokoyama
  • modified at 2019-05-22
  • stone: 1982-2
measured value uncertainty unit description
[SiO2] 44.8 %
[TiO2] 3.59 %
[Al2O3] 15.4 %
[MnO] 0.2 %
[MgO] 5.81 %
[CaO] 11.46 %
[Na2O] 3.76 %
[K2O] 1.44 %
[P2O5] 0.64 %
[LOI] -0.79 %
total 99.9 %
[Cr2O3] 72.0 ppm
[NiO] 70.0 ppm
name global-id
name spots global-id