C33 < 20190522153220-278462 > pub
  • technique: XRF procedures of Takei (2002)
  • device: XRF PANalytical PW2400
  • operator: Yokoyama
  • modified at 2019-05-24
  • stone: C33
measured value uncertainty unit description
[SiO2] 46.1 %
[TiO2] 3.33 %
[Al2O3] 16.0 %
[MnO] 0.2 %
[MgO] 5.36 %
[Na2O] 4.43 %
[K2O] 1.82 %
[P2O5] 0.85 %
[LOI] -0.57 %
total 99.8 %
[Cr2O3] 96.0 ppm
[NiO] 64.0 ppm
[CaO] 10.19 %
name global-id
name spots global-id