80821-3 < 20190514150547-697135 > pub
  • technique: XRF_procedure of Norrish and Chappell (1977)
  • device: XRF PANalytical PW2400
  • operator: Nakamura
  • modified at 2019-05-14
  • stone: 80821-3
measured value uncertainty unit description
[SiO2] 48.61 %
[TiO2] 1.3 %
[Al2O3] 15.48 %
[Fe2O3T] 12.43 %
[MnO] 0.15 %
[MgO] 8.04 %
[CaO] 8.49 %
[K2O] 0.66 %
[P2O5] 0.2 %
[Y] 21.4 ppm
[Rb] 14.1 ppm
[Sr] 340.0 ppm
[Cr] 340.0 ppm
[Ni] 132.0 ppm
name global-id
name spots global-id